Nano-scale Materials Characterisation

Materials characterisation is the use of external techniques to probe into the internal structure and properties of a material or object. Over the two days, the presentations, discussions and demonstrations focus on characterisation and problem-solving in surface and interface science and technology as well as characterisation of nanoparticles and nanostructures. In particular, the following groups of techniques are considered:

• Surface specific electron spectroscopic (XPS) and spectrometric (SIMS) techniques;
• Electron-optical analytical and imaging (EPMA/WDS, SEM/EDS, TEM/EDS, HRTEM) techniques;
• Photon spectroscopic (IR and Raman probes) and thin-film profilometry techniques;
• Scanning probe (AFM in various operational modes) and stylus (Dektak) techniques;
• Light scattering for particle characterisation (particle analysis, dynamic light scattering, centrifugal sedimentation, laser diffraction).

The course is held at the University of Oxford's Begbroke Science Park in association with BegbrokeNano, a well-established focus of characterisation expertise, and one of the UK Technology Strategy Board's Micro and Nanotechnology (MNT) Centres.

This face-to-face course gives an introduction to the most widely-used techniques for materials characterisation for nanoparticles, thin films and nanostructures.

During the weekend students are given information on the latest techniques for nanoparticle characterisation and demonstrated some of the latest pieces of equipment from manufacturers. Explanations of the principles behind the techniques and demonstrations of the equipment allow students to gain an understanding of how best to characterise nanomaterials.